In the nuclear explosion environment, it is required that the output voltage of Low Dropout Regulator(LDO) can recover quickly. The relationship between the output voltage recovery time and the load resistance after the instantaneous ionizing radiation has been qualitatively analyzed. The experimental study is carried out on the effects of instantaneous ionizing radiation based on the “Qiang–guang-I” accelerator. The close relationship is found exiting between the output voltage recovery time and the load resistance by analyzing many experimental results. The recovery time of the circuit can be effectively reduced by adjusting the load resistance value which is tested by the instantaneous ionizing radiation experiment. The test results show that LDO output voltage recovery time decreases to 100 μs after the instantaneous ionizing radiation of 1.0×1011 rad(Si)/s.