Electron irradiation test of anti-irradiation hardened package for home-made memory devices

Abstract:

Radiation hardened packages were prepared by using special composite shielding material and welding technique. Hardened package memory LS28C256R which was based on general package memory 28C256 was produced. Special experimental testing circuit and testing software were designed to dynamic test memory devices using linear electron accelerator. The result of contrastive irradiation test indicated that the performance of the hardened package memory LS28C256 in anti-electron irradiation was 1~2 orders of magnitude better than the general package memory. This hardened package method had provided technical support for the space application of COTS(Commercial Off-The-shelf) devices.