A method of silicon solar cells defect detection based on near-infrared images

Abstract:

Solar power is now the new energy which has huge development prospects，the advanced and efficient solar cell producing industry has great significance for solar power，so solar cells defect detection technology in the process of producing solar cell has huge application value. The new technology of using near-infrared imaging for solar cells defect detection shows high efficiency，however，the current industry only uses a relatively simple post-processing. Based on the near-infrared images of solar cell for some image processing，the defects of solar cells，such as debris，cracks，broken gate，etc.，can be identified more quickly. Compared with the traditional methods，this new method can identify more detection fault types with higher efficiency，therefore can significantly reduce the failure in the production of solar cell.