Parasitic modes caused by defect ground structure in multilayer integrated circuit
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1.Laboratory of Millimeter-wave and Terahertz Technology,Beijing Institute of Technology,Beijing 100081,China;2.Beijing Institute of Radio Measurement,Beijing 100854,China;3.Key Laboratory of MMW Monolithic Integrated;4.Circuits and Modules, Nanjing Electronic Devices Institute,Nanjing Jiangsu 210016,China

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    Abstract:

    In multilayer integrated circuit, the parasitic mode problem is caused by Defect Ground Structure(DGS).By comparing the effects of window shielding form and various back hole arrays in suppressing the propagation of parasitic modes, it is found that the window shielding form can effectively suppress the propagation of parasitic modes but greatly increase the circuit loss. The existence of the simplest back hole array can achieve parasitic suppression. Without changing the process structure, the double-back-hole form and the four-back-hole form can meet the suppression requirements of dielectric films below200 GHz and 300 GHz respectively. In these cases, the back holes occupy the smallest area. It can effectively reduce the back hole arrangement density and increase the circuit integration.

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侯彦飞,王伯武,于伟华,程伟,孙岩.多层集成电路中缺陷地引起的寄生基板模式[J]. Journal of Terahertz Science and Electronic Information Technology ,2022,20(6):626~630

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History
  • Received:March 30,2020
  • Revised:September 10,2020
  • Adopted:
  • Online: July 11,2022
  • Published: