Abstract:Steady-state X-ray source is an important radiation simulation device, which has important applications in research fields such as radiation effects. Electron emission occurs when X-ray bombards the target. Long-term bombarding will cause the accumulation of charge on the surface of the material or the effect of electron multiplication, which will lead to the change of material properties. The Monte Carlo simulation method is applied to calculate the X-ray energy spectrum at tube voltages of 50 kV, 150 kV and 225 kV, and the electron emission under X-ray irradiation is simulated. The focal spot distribution of X-ray and the dispersion of electron emission with collimating hole diameters of 2 mm, 4 mm and 6 mm are studied respectively, and the characteristics of electron emission energy spectrum and current intensity generated by X-ray bombardment of different energy spectra on samples such as polyethylene, polyimide, Si, SiO2, Cu, Ta and W are also studied, which can provide theoretical basis and guidance for the experimental research and design of electron emission characteristics of materials under X-ray irradiation.