Design of full electronic fuze tester based on dual core architecture
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Institute of Electronic Engineering,China Academy of Engineering Physics,Mianyang Sichuan 621999,China

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    Abstract:

    The traditional passive-resistance test of all electronic fuze adopts external on resistance test equipment or general on resistance test circuit design, which has nothing to do with the electrical performance test of full electronic fuze, and can not avoid the risk of the failure product burning after power on. Therefore, a systematic design idea is proposed to diagnose the electrical performance of passive-resistance and full electronic fuze. This paper designs a full-automatic test control architecture based on ARM chip and FPGA dual core architecture and a 24 bit high-precision four-wire passive-resistance test circuit. The passive-resistance of the external interface part of the all electronic fuze and the working characteristics of the fuze are comprehensively tested. The test results show that the design can be utilized to test the passive-resistance with high precision(the measuremetn accuracy is ±0.1%) as well as the comprehensive working performance after power on.

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周孟哲,周伟.基于双核架构的全电子引信测试仪设计[J]. Journal of Terahertz Science and Electronic Information Technology ,2023,21(2):176~182

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History
  • Received:October 08,2020
  • Revised:January 06,2021
  • Adopted:
  • Online: March 06,2023
  • Published: