1.The 30th Research Institute of China Electronics Technology Group Corporation,Chengdu Sichuan 610000,China;2.Research Institute of Electronic Science and Technology,University of Electronic Science and Technology of China, Chengdu Sichuan 611731,China
陈世康,郭爽,唐晋,袁健,林维涛,刘丹.多信道数据碎片化传输安全性证明[J]. Journal of Terahertz Science and Electronic Information Technology ,2023,21(3):371~377
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